Mingmei DIC metallographic microscope to observe conductive particles
Observe the number and distribution of the conductive particles to confirm whether the conductive particles meet the requirements. This is a must for every LCD module manufacturer.
Using a metallographic microscope series with polarization, polarization and DIC differential interference, it is possible to observe the conductive particles of the screen well and confirm whether the number of conductive particles meets the requirements.
First, it is necessary to observe that the conductive particles must have a metallographic microscope equipped with a DIC and a polarizing analyzer. For the observation of conductive particles, the lens that is generally selected is required to be no more than 20 times. The result is that the observation effect is blurred due to the problem of depth of field, and the best effect cannot be observed.
Mingmei MJ33DIC super cost-effective metallographic microscope is the best choice for observing conductive particles!
The following is a picture of conductive particles taken by our MJ33DIC supporting high-definition microscopic imaging system independently developed by our company:
The red area is a conductive particle and cannot be seen under the normal observation mode.
Lifting Pole,Hospital Lifting Pole,Monkey Pole With Stand,Hospital Lifting Equipment
Jiangmen Jia Mei Medical Products Co.,Ltd. , https://www.jiamei-medical.com